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CMP
Credit: Jack Hobhouse

David Keen

Visiting Professor

Sub department

  • Condensed Matter Physics

Research groups

  • X-ray and neutron scattering
david.keen@physics.ox.ac.uk
Telephone: 01865 (2)72310
Clarendon Laboratory, room 106
  • About
  • Publications

Determination of structural disorder in superionic by neutron total scattering

Journal of Physics Condensed Matter IOP Publishing 10:37 (1998) 8217

Authors:

David A Keen, Stephen Hull
More details from the publisher

Direct measurement of the Si–O bond length and orientational disorder in the high-temperature phase of cristobalite

Physics and Chemistry of Minerals Springer Nature 24:4 (1997) 311-317

Authors:

Martin T Dove, David A Keen, Alex C Hannon, Ian P Swainson
More details from the publisher

Refining disordered structural models using reverse monte carlo methods: Application to vitreous silica

Phase Transitions Taylor & Francis 61:1-4 (1997) 109-124
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Structural evidence for fast-ion conduction in the silver and copper halides at high temperatures and pressures

Ionics Springer Nature 3:3-4 (1997) 239-244

Authors:

NJG Gardner, W Hayes, S Hull, DA Keen
More details from the publisher

Neutron time-of-flight measurements of diffuse scattering

Physica B Condensed Matter 241-243 (1997) 201-203

Authors:

DA Keen, MJ Harris, WIF David

Abstract:

General surveys of reciprocal space are important for studies of many forms of crystalline disorder. In recent years, techniques for measuring good quality diffuse scattering from single crystals at pulsed neutron sources have been established. This paper shows how single-crystal time-of-flight neutron diffraction using large area position-sensitive detectors gives extremely rapid measurement of large volumes of reciprocal space to high Q. The effective measurement of more subtle, localised diffuse features using neutron time-of-flight instrumentation with highly collimated detectors is also described. Advantages and disadvantages over other neutron surveying techniques are discussed. Comparison of data quality (and quantity) is made with reference to diffuse scattering from C60 using the SXD diffractometer and from KNO3 using the PRISMA spectrometer, both at the ISIS source. © 1998 Elsevier Science B.V. All rights reserved.
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