Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy
JOURNAL OF APPLIED PHYSICS 85:6 (1999) 3301-3309
Picosecond-milliangstrom lattice dynamics measured by ultrafast X-ray diffraction
NATURE 398:6725 (1999) 310-312
Single-pulse time- and fluence-resolved optical measurements at femtosecond excited surfaces
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 69:5 (1999) 577-579
Ultrafast movies of atomic motion with femtosecond laser-based x-rays
P SOC PHOTO-OPT INS 3776 (1999) 302-311
Abstract:
Using ultrafast x-ray diffraction from a laser-plasma x-ray source, we have observed coherent phonon generation and propagation in bulk(111)-GaAs, (111)-Ge, and thin (Ill)-Ge-on-Si films. At higher optical pump fluences, ultrafast melting of Ge films is observed.Observation of a transient insulating phase of metals and semiconductors during short-pulse laser ablation
APPL SURF SCI 129 (1998) 755-760