Estimation of the compressibility of Na0.5Bi0.5TiO3 and related perovskite-type titanates
JOURNAL OF PHYSICS-CONDENSED MATTER 12:46 (2000) 9689-9698
X-ray diffraction, micro-Raman and birefringence imaging of silicon carbide
MATER SCI FORUM 353-3 (2000) 283-286
Abstract:
Transmission and reflection X-ray topography, birefringence imaging and Raman spectroscopy imaging have been performed on a silicon carbide slice. The differences between the images and the information obtained fr-om them are discussed in detail.JOURNAL OF APPLIED CRYSTALLOGRAPHY.
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 55 (1999)
MEASUREMENTS OF BIREFRINGENCE IN NONHOMOGENOUS SAMPLES.
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 55 (1999) 541-541
STUDIES OF FERROIC CRYSTALS BY OPTICAL METHODS
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 55 (1999) 29-29