Emeritus Professor Mike Glazer

Abstract:

The physical origin of the piezoelectric effect has been the focus of much research work. While it is commonly accepted that the origins of piezoelectricity may be intrinsic (related to the change of lattice parameters) and extrinsic (related to the movement of domain walls), their separation is often a challenging experimental task. Here in situ high-resolution synchrotron X-ray diffraction has been combined with a new data analysis technique to characterize the change of the lattice parameters and domain microstructure of a PbZr1−xTixO3 (x = 0.45) crystal under an external electric field. It is shown how `effective piezoelectric coefficients' evolve upon the transition from purely `intrinsic' effects to `extrinsic' ones due to domain-wall motion. This technique and corresponding data analysis can be applied to broader classes of materials and provide important insights into the microscopic origin of their physical properties.

Abstract:

PbZr1-xTixO3, which has abundant structural variations in the corresponding physical properties, has been used in a large variety of applications. To understand the effect of the structure on its high-performance piezoelectric properties, its local and average structures are studied. Total scattering data have been obtained from high-energy synchrotron powder diffraction experiments at 20 K and 300 K. Using the reverse Monte Carlo method, information on cation displacements has been extracted from X-ray Pair Distribution Function data. This suggests that the local disorder of the B cations is mainly driven by thermal motion, while the local disorder of Pb is most likely caused by more complex factors, such as displacive disorder. Both rhombohedral and monoclinic local polarizations are observed in Zr-rich PZT, whose directions depend on temperature.