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Insertion of STC into TRT at the Department of Physics, Oxford
Credit: CERN

Philip Burrows

Professor of Physics

Sub department

  • Particle Physics
Philip.Burrows@physics.ox.ac.uk
Telephone: 01865 (2)73451
Denys Wilkinson Building, room 615a
  • About
  • Publications

Luminosity Performance Studies of Linear Colliders with Intra-train Feedback Systems

(2009)

Authors:

J Resta-Lopez, PN Burrows, A Latina, D Schulte
More details from the publisher

Potential physics impact of the linear collider

Proceedings of Science 94 (2009)

Development of Fast Micron-Resolution Beam Position Monitors for Linear Collider Beam-Based Feedback Systems

2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9 (2009) 1573-+

Authors:

R Apsimon, PN Burrows, C Clarke, B Constance, H Dabiri-Khah, T Hartin, C Perry, J Resta-Lopez, C Swinson, G Christian, A Kalinin
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Latest Beam Test Results of the FONT4 ILC Intra-train Feedback System Prototype

(2009) 2676-2676

Authors:

PN Burrows, others

Development of fast micron-resolution beam position monitors for linear collider beam-based feedback systems

IEEE Nuclear Science Symposium Conference Record (2008) 2298-2301

Authors:

R Apsimon, PN Burrows, C Clarke, B Constance, H Dabiri-Khah, T Hartin, C Perry, J Resta-Lopez, C Swinson, G Christian, A Kalinin

Abstract:

Wt present the design of prototype fast beam position monitor (BPM) signal processors for use in inter-bunch beam-based feedbacks for linear colliders and electron linacs. We describe the FONT4 intra-train beam-based digital position feedback system prototype deployed at the Accelerator test facility (ATF) extraction line at KEK, Japan. The system incorporates a fast analogue beam position monitor front-end signal processor, a digital feedback board, and a fast kicker-driver amplifier. The total feedback system latency is less than 150ns, of which less than 10ns is used for the BPM processor. We report preliminary results of beam tests using electron bunches separated by c. 150ns. Position resolution of order 1 micron obtained. © 2008 IEEE.
More details from the publisher

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