Oxford Centre for High Energy Density Science (OxCHEDS)

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Time-resolved observation of ultrahigh intensity laser-produced electron jets propagating through transparent solid targets

Physical Review Letters 83:24 (1999) 5015-5018

Authors:

L Gremillet, F Amiranoff, SD Baton, JC Gauthier, M Koenig, E Martinolli, F Pisani, G Bonnaud, C Lebourg, C Rousseaux, C Toupin, A Antonicci, D Batani, A Bernardinello, T Hall, D Scott, P Norreys, H Bandulet, H Pépin

Abstract:

We report on shadowgraphic measurements showing the first space- and time-resolved snapshots of ultraintense laser pulse-generated fast electrons propagating through a solid target. A remarkable result is the formation of highly collimated jets (<20-μm) traveling at the velocity of light and extending up to 1 mm. This feature clearly indicates a magnetically assisted regime of electron transport, of critical interest for the fast ignitor scheme. Along with these jets, we detect a slower (≈c/2) and broader (up to 1 mm) ionization front consistent with collisional hot electron energy transport. 1999 © The American Physical Society.
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Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

Review of Scientific Instruments 70:1 II (1999) 629-632

Authors:

DH Kalantar, EA Chandler, JD Colvin, R Lee, BA Remington, SV Weber, LG Wiley, A Hauer, JS Wark, A Loveridge, BH Failor, MA Meyers, G Ravichandran

Abstract:

Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. © 1999 American Institute of Physics.
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Ultrafast structural dynamics in InSb measured using time-resolved X-ray diffraction

Optics Infobase Conference Papers (1999)

Authors:

AM Lindenberg, I Kang, S Johnson, RW Falcone, PA Heimann, HA Padmore, T Missalla, RW Lee, Z Chang, MM Murnane, HC Kapteyn, JS Wark

Ultrafast structural dynamics in InSb measured using time resolved X-ray diffraction

Institute of Electrical and Electronics Engineers (IEEE) (1999) 232-233

Authors:

AM Lindenberg, I Kang, S Johnson, RW Falcone, PA Heimann, HA Padmore, T Missalla, RW Lee, Z Chang, MM Murnane, HC Kapteyn, JS Wark
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Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

REV SCI INSTRUM 70:1 (1999) 629-632

Authors:

DH Kalantar, EA Chandler, JD Colvin, R Lee, BA Remington, SV Weber, A Hauer, JS Wark, A Loveridge, BH Failor, MA Meyers, G Ravichandran, LG Wiley

Abstract:

Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. (C) 1999 American Institute of Physics. [S0034-6748(99)62601-6].
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