Resist-Based Neutral Atom Lithography

Optics InfoBase Conference Papers (1998) 25-34

Authors:

JH Thywissen, KS Johnson, R Younkin, NH Dekker, KK Berggren, AP Chu, M Prentiss

Abstract:

We present a survey of neutral atom lithography, focusing on the development and use of resist/etch systems for atoms. The combination of nm-scale features, large-area parallel deposition, and effective resists demonstrates the promise of atoms as a lithographic element. We discuss the patterned direct deposition of atoms into a substrate, and the use of several resists: self-assembled monolayers of alkanethiolates on Au and of alkylsiloxanes on SiC>2, and "contamination" resists deposited from vapor. Features as narrow as 20nm have been transferred into a silicon substrates using a neutral atom resist/etch system. Unlike photons and electrons, noble gas atoms in energetic metastable states have an internal state structure that is easily manipulable, allowing novel lithographic schemes based on the optical quenching of internal energy.

Nanofabrication using neutral atomic beams

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena American Vacuum Society 15:6 (1997) 2093-2100

Authors:

JH Thywissen, KS Johnson, R Younkin, NH Dekker, KK Berggren, AP Chu, M Prentiss, SA Lee

Using neutral metastable argon atoms and contamination lithography to form nanostructures in silicon, silicon dioxide, and gold

Proceedings of SPIE--the International Society for Optical Engineering SPIE, the international society for optics and photonics 2995 (1997) 97-108

Authors:

Kent S Johnson, Karl K Berggren, Andrew J Black, Charles T Black, Arthur P Chu, Nynke H Dekker, DC Ralph, Joseph H Thywissen, Rebecca J Younkin, Mara Goff Prentiss, Michael Tinkham, George M Whitesides

Using neutral metastable argon atoms and contamination lithography to form nanostructures in silicon, silicon dioxide, and gold

Applied Physics Letters AIP Publishing 69:18 (1996) 2773-2775

Authors:

KS Johnson, KK Berggren, A Black, CT Black, AP Chu, NH Dekker, DC Ralph, JH Thywissen, R Younkin, M Tinkham, M Prentiss, GM Whitesides

Observation of the geometric amplitude factor in an optical system

Journal of Modern Optics Taylor & Francis 43:10 (1996) 2087-2103

Authors:

D Bouwmeestert, GP Karman, NH Dekker, CA Schrama, JP Woerdman