X-Ray Scattering Studies of Charge Stripes in La2-xSrxNiO4 (x=0.20-0.33)
International Journal of Modern Physics B World Scientific Publishing Company 16 (2002) 1633-1640
Abstract:
The La2-xSrxNiO4 system is isostructural with the high TC superconducting cuprate La2-xSrxCuO4 and is a prototypical system for the understanding of strongly correlated electron-phonon coupling, and the resultant effects on material properties. X-ray scattering studies have been performed on La5/3Sr1/3NiO4 that demonstrate the two-dimensional nature of these charge stripes. Such studies, demonstrate the very high correlation length of the stripes (~ 2000 Å) at low temperatures. We have undertaken a series of experiments measuring the wavevector and charge stripe correlation length on a variety of crystals with the compositions La2-xSrxNiO4 (x=0.20, 0.25, 0.275, 0.30 and 0.33) using ~10 keV X-rays. The results demonstrate that for x=0.275, and above, the charge stripes are highly correlated in a well-ordered crystalline lattice. Measurements of the incommensurability, ε, as a function of temperature for the series revealed that it is commensurate and temperature independent for the x=0.33 sample. For other compositions it is incommensurate and also temperature dependent. However for the x=0.20 and 0.25 crystals a much reduced correlation length was observed suggestive of a charge stripe glass. However, such experiments are sensitive to such charge ordering only in the near (top few micron) surface region. High energy X-rays however can probe the charge stripe ordering within the bulk of the single crystal by utilising the dramatic increase in penetration depth. We have used 130 keV X-rays and demonstrate that in La5/3Sr1/3NiO4 the charge stripes are far less correlated in the bulk than in the near surface region. This reduced correlation length (~300 Å), consistent with neutron scattering measurements, is indicative of a charge stripe glass, reminiscent of that observed below x=0.25, in the near surface region.X-ray scattering studies of charge stripes in La2−xSrxNiO4 (x=0.20−0.33)
Physica B 318 (2002) 289-294
Abstract:
The La2−xSrxNiO4 system is isostructural with the high TC superconducting cuprate La2−xSrxCuO4 and is a prototypical system for the understanding of strongly correlated electron–phonon coupling, and the resultant effects on material properties. At low temperatures La2−xSrxNiO4 undergoes a transition into a charge ordered regime whereby the dopant holes migrate to form hole rich regions, or stripes, behaving as anti-phase domain boundaries surrounded by hole deficient antiferromagnetic regions. X-ray scattering studies have been performed on La5/3Sr1/3NiO4 that demonstrate the two-dimensional nature of these charge stripes. Critical exponents governing the temperature variation of the intensity below TC, and the inverse correlation length above TC, have been measured that demonstrate this reduced dimensionality. We have undertaken a series of experiments measuring the wave vector and charge stripe correlation length on a variety of crystals with the compositions La2−xSrxNiO4 (x=0.20, 0.25, 0.275, 0.30 and 0.33) using not, vert, similar10 keV X-rays. The results demonstrate that for x=0.275, and above, the charge stripes are highly correlated in a well-ordered crystalline lattice. However, for the x=0.20 and 0.25 crystals, a much reduced correlation length was observed suggesting a charge stripe glass. Such studies, performed with traditional X-ray energies (not, vert, similar10 keV), demonstrate the very high-correlation length of the stripes (not, vert, similar2000 Å) at low temperatures. However, such experiments are sensitive to such charge ordering only in the near (top few μm) surface region. High energy X-rays, however, can probe the charge stripe ordering within the bulk of the single crystal by utilising the dramatic increase in penetration depth. We have used 130 keV X-rays and demonstrate that in La5/3Sr1/3NiO4 the charge stripes are far less correlated in the bulk than in the near surface region. This reduced correlation length (not, vert, similar300 Å), consistent with neutron scattering measurements, is indicative of a charge stripe glass, reminiscent of that observed below x=0.25 in the near surface region.MCGRtof: Monte Carlo G(r) with resolution corrections for time‐of‐flight neutron diffractometers
Journal of Applied Crystallography International Union of Crystallography (IUCr) 34:6 (2001) 780-782
Combined neutron and X-ray scattering study of phosphate glasses
Journal of Non-Crystalline Solids Elsevier 293 (2001) 158-168
Application of the reverse Monte Carlo method to crystalline materials
Journal of Applied Crystallography International Union of Crystallography (IUCr) 34:5 (2001) 630-638