Mapping the temperature dependent surface states of Bi2Te3 topological insulator flakes by ultra-cryogenic terahertz near-field nanoscopy
Abstract:
Topological insulators (TIs) have drawn considerable attention for next generation high sensitivity, high efficiency devices thanks to their unique metallic surface conductivity via their topologically-protected surface states (TSSs). In this study, we utilized near-field nanoimaging and nanoscale spectroscopy in the Terahertz (THz) frequency range to explore the optical response of the surface layer from Bi2Te3 TI flakes. In all cases, we observe a higher near-field optical response from the TI flakes compared to a Si substrate. This contrast increases for more surface sensitive probing, which indicates the presence of a conductive surface state. In addition, we have performed temperature dependent THz nanoscopy and demonstrate a significantly enhanced near-field contrast for the TI flake at a sample temperature of 8.9 K compared to the Si substrate. This temperature-dependent behavior provides vital insight into the underlying mechanisms behind the observed conductive surface state in TI materials.