Professor Justin Wark: Publications

DOUBLE-CRYSTAL HIGH-RESOLUTION X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMAS

REVIEW OF SCIENTIFIC INSTRUMENTS 64:1 (1993) 26-30

Authors:

H HE, JS WARK, E FOERSTER, I USCHMANN, O RENNER, M KOPECKY, W BLYTH

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EFFECT OF HIGH X-RAY FLUXES ON LASER-PLASMA X-RAY SPECTROMETERS

REVIEW OF SCIENTIFIC INSTRUMENTS 64:7 (1993) 1718-1722

Authors:

JS WARK, RR WHITLOCK

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ELECTRON-TEMPERATURE OF OPTICALLY IONIZED-GASES PRODUCED BY HIGH-INTENSITY 268 NM LASER-RADIATION

PHYSICAL REVIEW LETTERS 71:24 (1993) 3983-3986

Authors:

AA OFFENBERGER, W BLYTH, AE DANGOR, A DJAOUI, MH KEY, Z NAJMUDIN, JS WARK

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DIRECT MEASUREMENTS OF COMPRESSIVE AND TENSILE STRAIN DURING SHOCK BREAKOUT BY USE OF SUB-NANOSECOND X-RAY DIFFRACTION

Chapter in Shock Compression of Condensed Matter–1991, Elsevier (1992) 813-816

Authors:

JS WARK, NC WOOLSEY, D RILEY, W BLYTH, RR WHITLOCK, G KEIHN

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NOVEL MEASUREMENTS OF HIGH-DYNAMIC CRYSTAL STRENGTH BY PICOSECOND X-RAY-DIFFRACTION

APPLIED PHYSICS LETTERS 61:6 (1992) 651-653

Authors:

JS WARK, NC WOOLSEY, RR WHITLOCK

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Professor Justin Wark

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DOUBLE-CRYSTAL HIGH-RESOLUTION X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMAS

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EFFECT OF HIGH X-RAY FLUXES ON LASER-PLASMA X-RAY SPECTROMETERS

Authors:

ELECTRON-TEMPERATURE OF OPTICALLY IONIZED-GASES PRODUCED BY HIGH-INTENSITY 268 NM LASER-RADIATION

Authors:

DIRECT MEASUREMENTS OF COMPRESSIVE AND TENSILE STRAIN DURING SHOCK BREAKOUT BY USE OF SUB-NANOSECOND X-RAY DIFFRACTION

Authors:

NOVEL MEASUREMENTS OF HIGH-DYNAMIC CRYSTAL STRENGTH BY PICOSECOND X-RAY-DIFFRACTION

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Professor Justin Wark

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DOUBLE-CRYSTAL HIGH-RESOLUTION X-RAY SPECTROSCOPY OF LASER-PRODUCED PLASMAS

Authors:

EFFECT OF HIGH X-RAY FLUXES ON LASER-PLASMA X-RAY SPECTROMETERS

Authors:

ELECTRON-TEMPERATURE OF OPTICALLY IONIZED-GASES PRODUCED BY HIGH-INTENSITY 268 NM LASER-RADIATION

Authors:

DIRECT MEASUREMENTS OF COMPRESSIVE AND TENSILE STRAIN DURING SHOCK BREAKOUT BY USE OF SUB-NANOSECOND X-RAY DIFFRACTION

Authors:

NOVEL MEASUREMENTS OF HIGH-DYNAMIC CRYSTAL STRENGTH BY PICOSECOND X-RAY-DIFFRACTION

Authors: