Deep Level of ZnO/p-Si Heterostructure and Its Influence on the Photoluminescence
      Chn. J. Lumin. Chinese Academy of Science 2001:3 (2001) 218
    
        
    
    
        
      Electrical Properties of the ZnO/Si Heterostructure
      Chinese Physics Letters  18:8 (2001) 1108
    
    
        Abstract:
The electrical properties of a type of semiconductor heterostructure fabricated by depositing zinc oxide film on a silicon substrate are investigated. The I - V , I - T curves, and deep level transient spectra are measured. From these results, we acquire the information of the characteristics of the junction, and compute some energy levels of the samples.The interface properties of MIS structures on anodically oxidized GaSb
      Semiconductor Science and Technology IOP Publishing 12:9 (1997) 1140
    
        
    
    
        
      Improved photoluminescence from electrochemically passivated GaSb
      Semiconductor Science and Technology IOP Publishing 12:4 (1997) 413
    
        
    
    
        
      One dimensional transport and gating of InAs/GaSb structures
      Superlattices and Microstructures Elsevier 15:1 (1994) 41