Polarized neutron reflection as a probe of magnetic films and multilayers.
Phys Rev B Condens Matter 46:6 (1992) 3391-3400
SPIN-POLARIZED NEUTRON REFLECTION STUDIES OF EPITAXIAL-FILMS
J MAGN MAGN MATER 93 (1991) 513-522
Intrinsic magnetic order in Cs2AgF4 detected by muon-spin relaxation
PHYSICAL REVIEW B 75 22
Abstract:
We present the results of a muon-spin relaxation study of the high-T-c analog material Cs2AgF4. We find unambiguous evidence for magnetic order, intrinsic to the material, below T-C=13.95(3) K. The ratio of interplane to intraplane coupling is estimated to be vertical bar J(’)/J vertical bar=1.9x10(-2), while fits of the temperature dependence of the order parameter reveal a critical exponent beta=0.292(3), implying an intermediate character between pure two- and three-dimensional magnetism in the critical regime. Above T-C we observe a signal characteristic of dipolar interactions due to linear F-mu(+)-F bonds, allowing the muon stopping sites in this compound to be characterized.Spin Jahn-Teller antiferromagnetism in CoTi$_2$O$_5$
Physical Review B American Physical Society
Abstract:
We have used neutron powder diffraction to solve the magnetic structure of orthorhombic CoTi$_2$O$_5$, showing that the long-range ordered state below 26 K identified in our muon-spin rotation experiments is antiferromagnetic with propagation vector ${\bf k}=(\pm \frac{1}{2}, \frac{1}{2}, 0)$ and moment of 2.72(1)$\mu_{\rm B}$ per Co$^{2+}$ ion. This long range magnetic order is incompatible with the experimentally determined crystal structure because the imposed symmetry completely frustrates the exchange coupling. We conclude that the magnetic transition must therefore be associated with a spin Jahn-Teller effect which lowers the structural symmetry and thereby relieves the frustration. These results show that CoTi$_2$O$_5$ is a highly unusual low symmetry material exhibiting a purely spin-driven lattice distortion critical to the establishment of an ordered magnetic ground state.Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi
arXiv:1511.04972v1