Femtosecond Optical and X-Ray Measurement of the Semiconductor-to-Metal Transition in VO2
Institute of Electrical and Electronics Engineers (IEEE) (2001) 162-162
Observation of ultrafast structural transitions in solids using femtosecond x-ray pulses
Optics InfoBase Conference Papers (2001)
Abstract:
Time-resolved x-ray diffraction using multi-keV x-ray pulses reveals non-thermal changes of the lattice structure in less than 300 fs in a semiconductor and, for the first time, in a metal.Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
Journal De Physique. IV : JP 11:2 (2001)
Abstract:
A study of lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures, using time-resolved x-ray diffraction, was presented. Fast energy transport deep into the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interfaces were observed. Graphs showing time-dependent shifts of the centroid of the measured rocking curves in the Ge-overlayer and in the Si-substrate for different fluences, were presented.Ultrafast structural dynamics in solids investigated with femtosecond x-ray pulses
Optics InfoBase Conference Papers (2001)
Abstract:
Time-resolved x-ray diffraction using femtosecond, multi-keV x-ray pulses from a laser-produced plasma directly reveals non-thermal structural changes in a semiconductor and, for the first time, in a metal.'Ultrafast' extended to X-rays: Femtosecond time-resolved X-ray diffraction
ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS 215 (2001) 1527-1541