Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
Journal De Physique. IV : JP 11:2 (2001)
Abstract:
A study of lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures, using time-resolved x-ray diffraction, was presented. Fast energy transport deep into the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interfaces were observed. Graphs showing time-dependent shifts of the centroid of the measured rocking curves in the Ge-overlayer and in the Si-substrate for different fluences, were presented.Ultrafast structural dynamics in solids investigated with femtosecond x-ray pulses
Optics InfoBase Conference Papers (2001)
Abstract:
Time-resolved x-ray diffraction using femtosecond, multi-keV x-ray pulses from a laser-produced plasma directly reveals non-thermal structural changes in a semiconductor and, for the first time, in a metal.'Ultrafast' extended to X-rays: Femtosecond time-resolved X-ray diffraction
ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS 215 (2001) 1527-1541
Ablation dynamics of solids heated by femtosecond laser pulses
P SOC PHOTO-OPT INS 4423 (2001) 186-196
Abstract:
Ultrafast time resolved microscopy of femtosecond laser irradiated surfaces reveals a universal feature of the ablating surface on nanosecond time scale. All investigated materials show rings in the ablation zone, which were identified as an interference pattern (Newton fringes). Optically sharp surfaces occur during expansion of the heated material as a result of anomalous hydrodynamic expansion effects. Experimentally, the rings are observed within a certain fluence range which strongly depends on material parameters. The lower limit of this fluence range is the ablation threshold. We predict a fluence ratio between the upper and the lower fluence limit approximately equal to the ratio of critical temperature to boiling temperature at normal pressure. This estimate is experimentally confirmed on different materials (Si, graphite, Au, Al).Characterization of a broadband multi-keV laser plasma x-ray source for femtosecond time-resolved EXAFS
P SOC PHOTO-OPT INS 4504 (2001) 49-55