X-ray diffraction study of Co-Cu superlattices
Journal of Physics Condensed Matter 12:30 (2000) 6755-6771
Authors:
AY Babkevich, RA Cowley, P Goddard, R Schlinkert, BM Murphy, SP Collins, BJ Hickey
Abstract:
Epitaxial Co/Cu superlattices were grown by molecular beam epitaxy on sapphire substrates and investigated by high-resolution x-ray diffraction at room temperature. Detailed analysis of x-ray scattering along the [10.L] reciprocal-lattice rows revealed that about 80% of Co was hexagonal close packed (h.c.p.) and only 20% was face-centred cubic (f.c.c.). A combination of modelling of x-ray scattering from superlattices with measurements of coherence lengths of individual components of the scattering suggests that the f.c.c. Co grows as a single block at the beginning of Co layers and the growth presumably starts from islands rather than from continuous Co layers. The h.c.p, structure is one-dimensionally disordered by stacking faults which appear after approximately every 12 layers of Co on average. Upon heating in ultrahigh vacuum to 700 °C the coherent superlattice structure was completely destroyed and the resulting structure consisted of relaxed layers of Co and Cu.