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Single trapped ion

Single trapped ion

Credit: David Nadlinger

David Lucas

Professor of Physics

Sub department

  • Atomic and Laser Physics

Research groups

  • Ion trap quantum computing
David.Lucas@physics.ox.ac.uk
Telephone: 01865 (2)72384,01865 (2)72346
Clarendon Laboratory, room -170,-172,-171,316.6
  • About
  • Publications

Background-free detection of trapped ions

ArXiv 1110.557 (2011)

Authors:

NM Linke, DTC Allcock, DJ Szwer, CJ Ballance, TP Harty, HA Janacek, DN Stacey, AM Steane, DM Lucas

Abstract:

We demonstrate a Doppler cooling and detection scheme for ions with low-lying D levels which almost entirely suppresses scattered laser light background, while retaining a high fluorescence signal and efficient cooling. We cool a single ion with a laser on the 2S1/2 to 2P1/2 transition as usual, but repump via the 2P3/2 level. By filtering out light on the cooling transition and detecting only the fluorescence from the 2P_3/2 to 2S1/2 decays, we suppress the scattered laser light background count rate to 1 per second while maintaining a signal of 29000 per second with moderate saturation of the cooling transition. This scheme will be particularly useful for experiments where ions are trapped in close proximity to surfaces, such as the trap electrodes in microfabricated ion traps, which leads to high background scatter from the cooling beam.
Details from ArXiV
More details from the publisher

Background-free detection of trapped ions

(2011)

Authors:

NM Linke, DTC Allcock, DJ Szwer, CJ Ballance, TP Harty, HA Janacek, DN Stacey, AM Steane, DM Lucas
More details from the publisher

Reduction of heating rate in a microfabricated ion trap by pulsed-laser cleaning

(2011)

Authors:

DTC Allcock, L Guidoni, TP Harty, CJ Ballance, MG Blain, AM Steane, DM Lucas
More details from the publisher

Heating rate and electrode charging measurements in a scalable, microfabricated, surface-electrode ion trap

ArXiv (2011)

Authors:

DTC Allcock, TP Harty, HA Janacek, NM Linke, CJ Ballance, AM Steane, DM Lucas, RLJ Jr, SD Habermehl, MG Blain, D Stick, DL Moehring

Abstract:

We characterise the performance of a surface-electrode ion "chip" trap fabricated using established semiconductor integrated circuit and micro-electro-mechanical-system (MEMS) microfabrication processes which are in principle scalable to much larger ion trap arrays, as proposed for implementing ion trap quantum information processing. We measure rf ion micromotion parallel and perpendicular to the plane of the trap electrodes, and find that on-package capacitors reduce this to <~ 10 nm in amplitude. We also measure ion trapping lifetime, charging effects due to laser light incident on the trap electrodes, and the heating rate for a single trapped ion. The performance of this trap is found to be comparable with others of the same size scale.
More details
More details from the publisher
Details from ArXiV

Heating rate and electrode charging measurements in a scalable, microfabricated, surface-electrode ion trap

(2011)

Authors:

DTC Allcock, TP Harty, HA Janacek, NM Linke, CJ Ballance, AM Steane, DM Lucas, RL Jarecki, SD Habermehl, MG Blain, D Stick, DL Moehring
More details from the publisher

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