Preliminary Characterisation of Titanium Nitride Thin Film at 300 mK for the Development of Kinetic Inductance Travelling Wave Parametric Amplifiers
Preliminary characterisation of titanium nitride thin film at 300 mK for the development of kinetic inductance travelling wave parametric amplifiers
Proceedings of the SPIE Photonex + Vacuum Technologies Society of Photo-optical Instrumentation Engineers 11881