Nanosecond x-Ray diffraction from polycrystalline and amorphous materials in a pinhole camera geometry suitable for laser shock compression experiments
REVIEW OF SCIENTIFIC INSTRUMENTS 78:8 (2007) ARTN 083908
Simulating EXAFS patterns of shocked crystals
AIP Conf. Proc. 955 (2007) 1243-1246
Abstract:
Extended X-ray absorption fine structure (EXAFS) measurements on shocked polycrystalline iron have provided further evidence for the shock induced α - ε phase transition in iron. However, recent molecular dynamics investigation of this system has suggested the presence of fcc material in the shocked region. In this paper we will investigate the difficulties in simulating EXAFS signals from molecular dynamics data. We will aim to show that in the case of the shock induced α - ε transition EXAFS is insensitive to the type of close packing of the product phase. © 2007 American Institute of Physics.Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
AIP CONF PROC 955 (2007) 325-328
Abstract:
Over the past few years we have been pioneering the use of sub-nanosecond X-ray diffraction to determine the phase and compression of shocked crystals. It is well known that the deviation of atoms from their ideal lattice sites due to thermal motion reduces the integrated intensity within diffraction peaks - the so-called Debye-Waller effect, and thus it is pertinent to investigate whether line ratios might be sufficiently sensitive to be used as a viable temperature diagnostic. Clearly the matter is not completely straight-forward, as the Debye frequency of a solid also varies under compression. In our initial investigations we have calculated the ratios of intensities of high-order reflections assuming various forms of the Gruneisen parameter, and have also compared these results with those obtained from Molecular Dynamics simulations. Given the photon energies of nanosecond X-ray pulses that can currently be produced, we comment on the experimental feasibility of the technique.In situ diffraction measurements of lattice response due to shock loading, including direct observation of the alpha-epsilon phase transition in iron
INT J IMPACT ENG 33:1-12 (2006) 343-352
Abstract:
In situ diffraction is a technique to probe directly the lattice response of materials during the shock loading process. It is used to record diffraction patterns from multiple lattice planes simultaneously. The application of this technique is described for laser-based shock experiments. The approach to analyze in situ wide-angle diffraction data is discussed. This is presented in the context of single crystal [001] iron shock experiments where uniaxial compression of the bee lattice by up to 6% was observed. Above the alpha-epsilon transition pressure, the lattice showed a collapse along the [001] direction by 15-18%. Additional diffraction lines appear that confirm the transformation of the iron crystal from the initial bee phase to the hcp phase. (C) 2006 Elsevier Ltd. All rights reserved.Picosecond X-ray diffraction studies of shocked single crystals
Proceedings of SPIE - The International Society for Optical Engineering 6261 I (2006)