Quantum and optical technology

Abstract:

The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern superresolution microscopy techniques employ active interaction with the object by exploiting its optical nonlinearities, nonclassical properties of the illumination beam, or near field probing. Thus, they are not applicable whenever such interaction is not possible, for example, in astronomy or noninvasive biological imaging. Far field, linear optical superresolution techniques based on passive analysis of light coming from the object would cover these gaps. In this Letter, we present the first proof-of-principle demonstration of such a technique for 2D imaging. It works by accessing information about spatial correlations of the image optical field and, hence, about the object itself via measuring projections onto Hermite-Gaussian transverse spatial modes. With a basis of 21 spatial modes in both transverse dimensions, we perform two-dimensional imaging with twofold resolution enhancement beyond the diffraction limit.

Abstract:

The time-symmetric formalism endows the weak measurement and its outcome, the weak value, with many unique features. In particular, it allows a direct tomography of quantum states without resorting to complicated reconstruction algorithms and provides an operational meaning to wave functions and density matrices. Here, we propose and experimentally demonstrate the direct tomography of a measurement apparatus by taking the backward direction of weak measurement formalism. Our protocol works rigorously with the arbitrary measurement strength, which offers improved accuracy and precision. The precision can be further improved by taking into account the completeness condition of the measurement operators, which also ensures the feasibility of our protocol for the characterization of the arbitrary quantum measurement. Our work provides new insight on the symmetry between quantum states and measurements, as well as an efficient method to characterize a measurement apparatus.