Thin film quantum materials

Abstract:

Using soft x-ray absorption spectroscopy we determined the chemical and magnetic properties of the magnetic topological insulator (MTI) Cr:Sb2Te3. X-ray magnetic circular dichroism (XMCD) at the Cr L2,3, Te M4,5, and Sb M4,5 edges shows that the Te 5p moment is aligned antiparallel to both the Cr 3d and Sb 5p moments, which is characteristic for carrier-mediated ferromagnetic coupling. Comparison of the Cr L2,3 spectra with multiplet calculations indicates a hybridized Cr state, consistent with the carrier-mediated coupling scenario. We studied the enhancement of the Curie temperature, TC, of the MTI thin film through the magnetic proximity effect. Arrott plots, measured using the Cr L3 XMCD, show a TC ≈ 87 K for the as-cleaved film. After deposition of a thin layer of ferromagnetic Co onto the surface, the TC increases to ∼93 K, while the Co and Cr moments are parallel. This increase in TC is unexpectedly small compared to similar systems reported earlier. The XMCD spectra demonstrate that the Co/MTI interface remains intact, i.e., no reaction between Co and the MTI takes place. Our results are a useful starting point for refining the physical models of Cr-doped Sb2Te3, which is required for making use of them in device applications.

Abstract:

The mathematical concept of topology has brought about significant advantages that allow for a fundamental understanding of the underlying physics of a system. In magnetism, the topology of spin order manifests itself in the topological winding number which plays a pivotal role for the determination of the emergent properties of a system. However, the direct experimental determination of the topological winding number of a magnetically ordered system remains elusive. Here, we present a direct relationship between the topological winding number of the spin texture and the polarized resonant X-ray scattering process. This relationship provides a one-to-one correspondence between the measured scattering signal and the winding number. We demonstrate that the exact topological quantities of the skyrmion material Cu2OSeO3 can be directly experimentally determined this way. This technique has the potential to be applicable to a wide range of materials, allowing for a direct determination of their topological properties.

Abstract:

We have measured the terahertz (THz) conductance of a 23 quintuple layer thick film of bismuth selenide (Bi2Se3) and found signatures for topological surface states (TSSs) below 50 K. We provide evidence for a topological phase transition as a function of lattice temperature by optical means. In this work, we used THz time-domain spectroscopy (THz-TDS) to measure the optical conductance of Bi2Se3, revealing metallic behavior at temperatures below 50 K. We measure the THz conductance of Bi2Se3 as 10 e2/h at 4 K, indicative of a surface dominated response. Furthermore, the THz conductance spectra reveal characteristic features at ~1.9 THz attributed to the optical phonon mode, which is weakly visible at low temperatures but which becomes more prominent with increasing temperature. These results present a first look at the temperature-dependent behavior of TSSs in Bi2Se3 and the capability to selectively identify and address them using THz spectroscopy.