Dr Joseph Goodwin

Abstract:

Robust qubit memory is essential for quantum computing, both for near-term devices operating without error correction, and for the long-term goal of a fault-tolerant processor. We directly measure the memory error ε_m for a ⁴³Ca⁺ trapped-ion qubit in the small-error regime and find ε_m<10⁻⁴ for storage times t ≲ 50  ms. This exceeds gate or measurement times by three orders of magnitude. Using randomized benchmarking, at t = 1  ms we measure ε_m=1.2(7)×10⁻⁶, around ten times smaller than that extrapolated from the T^∗₂ time, and limited by instability of the atomic clock reference used to benchmark the qubit.

Abstract:

Ion traps are often loaded from atomic beams produced by resistively heated ovens. We demonstrate an atomic oven which has been designed for fast control of the atomic flux density and reproducible construction. We study the limiting time constants of the system and, in tests with 40Ca, show we can reach the desired level of flux in 12 s, with no overshoot. Our results indicate that it may be possible to achieve an even faster response by applying an appropriate one-off heat treatment to the oven before it is used.