Oxford Centre for High Energy Density Science (OxCHEDS)

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Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

Review of Scientific Instruments 70:1 II (1999) 629-632

Authors:

DH Kalantar, EA Chandler, JD Colvin, R Lee, BA Remington, SV Weber, LG Wiley, A Hauer, JS Wark, A Loveridge, BH Failor, MA Meyers, G Ravichandran

Abstract:

Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. © 1999 American Institute of Physics.
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Ultrafast structural dynamics in InSb measured using time-resolved X-ray diffraction

Optics InfoBase Conference Papers (1999)

Authors:

AM Lindenberg, I Kang, S Johnson, RW Falcone, PA Heimann, HA Padmore, T Missalla, RW Lee, Z Chang, MM Murnane, HC Kapteyn, JS Wark

Ultrafast structural dynamics in InSb measured using time resolved X-ray diffraction

Institute of Electrical and Electronics Engineers (IEEE) (1999) 232-233

Authors:

AM Lindenberg, I Kang, S Johnson, RW Falcone, PA Heimann, HA Padmore, T Missalla, RW Lee, Z Chang, MM Murnane, HC Kapteyn, JS Wark
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Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

REV SCI INSTRUM 70:1 (1999) 629-632

Authors:

DH Kalantar, EA Chandler, JD Colvin, R Lee, BA Remington, SV Weber, A Hauer, JS Wark, A Loveridge, BH Failor, MA Meyers, G Ravichandran, LG Wiley

Abstract:

Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. (C) 1999 American Institute of Physics. [S0034-6748(99)62601-6].
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Characterization of x-ray lasers at short wavelengths

INST PHYS CONF SER 159 (1999) 59-65

Authors:

GJ Tallents, JY Lin, R Smith, AG MacPhee, E Wolfrum, J Zhang, G Eker, R Keenan, CLS Lewis, D Neely, RMN O'Rourke, GJ Pert, SJ Pestehe, JS Wark

Abstract:

Experimental measurements of the optimum pulse delay and pulse irradiance ratio for lasing at 7.3 nm in Ni-like samarium are shown to be explained by a simple model. Experimental x-ray laser outputs are also shown to be well fitted with a simple one-dimensional ASE variation of the laser output with increasing target length through saturation. The ASE model is modified to take account of the two lasing lines present in Ni-like lasing and compared to experimental laser output measurements for Ni-like Dy lasing at 5.86 nm and 6.37 nm. The good agreement of experimental data with the ASE model indicates that refraction, non-uniformity of the laser medium and other problems traditionally associated with x-ray lasing are not significant with double pulse pumping.
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