Measurements of the hole boring velocity from Doppler shifted harmonic emission from solid targets

PHYSICS OF PLASMAS 3:9 (1996) 3242-3244

Authors:

M Zepf, M CastroColin, D Chambers, SG Preston, JS Wark, J Zhang, CN Danson, D Neely, PA Norreys, AE Dangor, A Dyson, P Lee, AP Fews, P Gibbon, S Moustaizis, MH Key

Radiography measurements of direct drive imprint in thin Al foils using a bright XUV laser

INST PHYS CONF SER (1996) 509-511

Authors:

PJ Warwick, A Demir, DH Kalantar, MH Key, NS Kim, CLS Lewis, J Lin, AG MacPhee, D Neely, BA Remington, S Rose, R Smith, GJ Tallents, JS Wark, SV Weber, E Wolfrum, J Zhang

Abstract:

A saturated XUV laser operating on the J=0-1, 19.6nm transition of Ne-like Germanium provided an excellent source to provide in-line backlighting for 2D imaged radiography. The imprint of a direct drive laser beam and subsequent Rayleigh-Taylor growth of perturbations in a 2 mu m thick Al foil, irradiated with 0.53 mu m laser light at 2-8x10(12) W/cm(2), was investigated. Measurements are presented for the modulation Slue to random phase plate static speckle, SSD smoothed and ISI smoothed speckle. In addition we present a study of single mode optical imprint generated by the interference pattern of a double rectangular aperture.

Radiography measurements of direct drive imprint in thin Al foils using a bright XUV laser

X-RAY LASERS 1996 (1996) 509-511

Authors:

PJ Warwick, A Demir, DH Kalantar, MH Key, NS Kim, CLS Lewis, J Lin, AG MacPhee, D Neely, BA Remington, S Rose, R Smith, GJ Tallents, JS Wark, SV Weber, E Wolfrum, J Zhang

Research on compact, bright, coherent x-ray sources at RAL

P SOC PHOTO-OPT INS 2778 (1996) 1199-1200

Authors:

J Zhang, A Behjat, AE Dangor, C Danson, A Demir, L Dwivedi, EE Fill, M Holden, PB Holden, MH Key, CLS Lewis, YL Li, P Loukakos, AG MacPhee, S Moustaizis, D Neely, PA Norreys, GJ Pert, SA Ramsden, SJ Rose, D Schlogl, YF Shao, J Steingruber, GJ Tallents, O Thomas, F Walsh, JS Wark, YL You, M Zepf, P Zeitoun

Saturated output of a Ge XXIII x-ray laser at 19.6 nm

PHYSICAL REVIEW A 54:6 (1996) R4653-R4656

Authors:

J Zhang, PJ Warwick, E Wolfrum, MH Key, C Danson, A Demir, S Healy, DH Kalantar, NS Kim, CLS Lewis, J Lin, AG MacPhee, D Neely, J Nilsen, GJ Pert, R Smith, GJ Tallents, JS Wark