Saturated and near-diffraction-limited operation of an XUV laser at 23.6 nm
Physical Review Letters 68:19 (1992) 2917-2920
Abstract:
Amplification of spontaneous emission (ASE) at 23.6 nm has been studied in a Ge plasma heated by a 1 TW infrared laser pulse. The exponent of the axial gain reached 21 in a geometry with Fresnel number 1. Two plasma columns of combined length up to 36 mm were used with an extreme ultraviolet mirror giving double-pass amplification. Saturation of the ASE output was observed. The beam divergence was about 8× diffraction limited with a brightness estimated at 1014 W cm-2 sr-1. The feedback from the mirror was significantly reduced probably by radiation damage from the plasma. © 1992 The American Physical Society.COLLISION PUMPED SOFT-X-RAY LASERS - PROGRESS AT RAL
INSTITUTE OF PHYSICS CONFERENCE SERIES (1992) 23-30
DIRECT MEASUREMENTS OF COMPRESSIVE AND TENSILE STRAIN DURING SHOCK BREAKOUT BY USE OF SUB-NANOSECOND X-RAY DIFFRACTION
Chapter in Shock Compression of Condensed Matter–1991, Elsevier (1992) 813-816
NOVEL MEASUREMENTS OF HIGH-DYNAMIC CRYSTAL STRENGTH BY PICOSECOND X-RAY-DIFFRACTION
APPLIED PHYSICS LETTERS 61:6 (1992) 651-653
PLASTICITY IN SHOCKED SINGLE CRYSTALS VIEWED BY PULSED X-RAY DIFFRACTION
Chapter in Shock Compression of Condensed Matter–1991, Elsevier (1992) 809-812