Catalyst-free growth of Bi2Te3 nanostructures by molecular beam epitaxy
Applied Physics Letters AIP Publishing 105:15 (2014) 153114
Magnetic Cr doping of Bi2Se3: Evidence for divalent Cr from x-ray spectroscopy
Physical Review B American Physical Society (APS) 90:13 (2014) 134402
Preparation of layered thin film samples for angle-resolved photoemission spectroscopy
Applied Physics Letters AIP Publishing 105:12 (2014) 121608
Magnetic ordering in Cr-doped Bi₂Se₃ thin films
Europhysics Letters European Physical Society 107:5 (2014) 57009-57009
Abstract:
We report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. Highresolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was found to be ∼2.1 μB per Cr ion. The magnetic hysteresis curve shows an open loop with a coercive field of ∼10 mT. The ferromagnetic transition temperature was determined to be 8.5 K analyzing the magnetizationtemperature gradient. PNR shows the film to be homogeneously ferromagnetic with no enhanced magnetism near the surface or interface.Three dimensional magnetic abacus memory
Scientific Reports Nature Publishing Group 4:1 (2014) 6109