Towards quantitative magnetic force microscopy: theory and experiment
New Journal of Physics IOP Publishing 14:4 (2012) 043044
Anisotropic bimodal distribution of blocking temperature with multiferroic BiFeO3 epitaxial thin films
Applied Physics Letters AIP Publishing 100:7 (2012) 072402
Interface Characterization of Epitaxial Fe/MgO/Fe Magnetic Tunnel Junctions
Journal of Nanoscience and Nanotechnology 12:2 (2012) 1006-1023
An undergraduate nanotechnology engineering laboratory course on atomic force microscopy
IEEE Transactions on Education 54:3 (2011) 428-441
Abstract:
The University of Waterloo, Waterloo, ON, Canada, is home to North America's first undergraduate program in nanotechnology. As part of the Nanotechnology Engineering degree program, a scanning probe microscopy (SPM)-based laboratory has been developed for students in their fourth year. The one-term laboratory course Nanoprobing and Lithography is accompanied by a preceding one-term lecture course, Nanoprobing and Lithography. The lecture course lays the theoretical foundation for the concepts covered in the laboratory course. The students work in groups of two and obtain hands-on experience in biweekly 3-h laboratory sessions. The labs use a dedicated undergraduate SPM teaching facility consisting of five atomic force microscope stations. The laboratory course covers all common standard modes of operation, as well as force spectroscopy, electrostatic force microscopy, magnetic force microscopy, and scanning probe lithography by electrochemical oxidation and scratching/ploughing of resist. In light of the breadth of the nanotechnology engineering educational program in terms of synthesis and characterization of nanomaterials, the authors designed a dedicated SPM lab with a capacity of up to 130 students per term. © 2010 IEEE.Micromagnetic analysis of unusual, V-shaped domain transitions in MnAs nanowires
Journal of Magnetism and Magnetic Materials 323:14 (2011) 1840-1845