Stress and relief of misfit strain of Ge/Si(001)

Physical Review Letters 80:11 (1998) 2382-2385

Authors:

G Wedler, J Walz, T Hesjedal, E Chilla, R Koch

Abstract:

The intrinsic stress of the Stranski-Krastanov system Ge/Si(001) was investigated in the range 700 1050 K. Characteristic stress features indicate that the relief of the misfit strain proceeds mainly in two steps: (i) by the formation of 3D islands on top of the Ge wetting layer and (ii) via misfit dislocations in larger 3D islands and upon their percolation. The temperature dependence of strain relief by 3D islands as well as their nucleation and growth behavior support a kinetic pathway for 3D islanding. © 1998 The American Physical Society.

Surfing the SAW: Visualizing the oscillation of Au(111) surface atoms

Proceedings of the IEEE Ultrasonics Symposium 1 (1997) 511-514

Authors:

T Hesjedal, E Chilla, HJ Froehlich

Abstract:

In this paper we report the observation of surface acoustic waves using a scanning tunneling microscope (STM). As the STM's control electronics has a bandwidth limit in the kHz range, SAWs at typical frequencies of MHz to GHz cause a loss of contrast which can be clearly seen on an atomic scale. In order to access the amplitude and phase of a SAW, we introduced a heterodyning type STM, the scanning acoustic tunneling microscope (SATM). Contrary to the STM technique, the SATM measures snapshots of the state of oscillation. On the nanometer scale, two contributions to the phase and amplitude contrast are discussed. First, the SAWs phase delay gives a mainly linear dependence on the distance of the source. Second, the atomic oscillation trajectories within the SAW lead to a signal contribution that is made up of the shape of the oscillation trajectory and the local topography. On an atomic scale where the influence of the phase delay on the contrast can be neglected the oscillation trajectories of single surface atoms are studied. Finally, the atomically resolved phase and amplitude images are compared to simulated data.

Towards the determination of elastic constants on a submicron scale using scanning acoustic force microscopy

Proceedings of the IEEE Ultrasonics Symposium 1 (1997) 549-552

Authors:

T Hesjedal, E Chilla, HJ Froehlich

Abstract:

This paper reports first steps towards the determination of elastic constants with submicron lateral resolution. The experimental phase velocity dispersion data were obtained on a micron scale using scanning acoustic force microscopy. The minimum of the corresponding error field is only weakly localized, thus giving a large error for the elastic constants. The localization can not be increased by using more of data points. In order to decrease the elastic constant's error, a Love mode is additionally regarded. However, the error field crossing is in this case not leading to a significant increase of the accuracy. We propose the inclusion of further surface guided modes.

High resolution visualization of acoustic wave fields within surface acoustic wave devices

Applied Physics Letters 70:11 (1997) 1372-1374

Authors:

T Hesjedal, E Chilla, HJ Fröhlich

Abstract:

We present the submicron visualization of surface acoustic wave (SAW) fields within interdigital transducers (IDTs) obtained by a scanning acoustic force microscope. Utilizing the nonlinear force curve of the tip-to-surface interaction, a periodic deflection of the cantilever appears when the SAWs are excited intermittently. This deflection depends on the amplitude of the surface oscillation and was measured by lock-in technique. SAWs with operating frequencies above 600 MHz were detected. The influence of the mass loading on the local oscillation amplitude was studied for various layer thicknesses of the IDT electrodes. © 1997 American Institute of Physics.

Nanoscale determination of phase velocity by scanning acoustic force microscopy

Physical Review B - Condensed Matter and Materials Physics 55:23 (1997) 15852-15855

Authors:

E Chilla, T Hesjedal, HJ Fröhlich

Abstract:

We measured the phase velocity of surface acoustic waves (SAWșs) with a scanning acoustic force microscope (SAFM) and achieved a maximum lateral resolution of 19.9 nm. The phase measurement of high-frequency waves with a slowly responding SAFM cantilever was perfomed by frequency mixing at its nonlinear force curve. For Au layers of different thicknesses the SAW dispersion was studied on a lateral scale of 200 nm and compared to calculated data. © 1997 The American Physical Society.