Focal aberrations of large-aperture HOPG von-Hàmos x-ray spectrometers
Journal of Instrumentation 7:9 (2012)
Abstract:
Focal aberrations of large-aperture highly oriented pyrolytic graphite (HOPG) crystals in von-Hàmos geometry are investigated by experimental and computational methods. A mosaic HOPG crystal film of 100 μm thickness diffracts 8 keV x-rays. This thickness is smaller than the absorption depth of the symmetric 004-reflection, which amounts to 257 μm. Cylindrically bent crystals with 110mm radius of curvature and up to 100 mm collection width produce a X-shaped halo around the focus. This feature vanishes when the collection aperture is reduced, but axial spectral profiles show that the resolution is not affected. X-ray topography reveals significant inhomogeneous crystallite domains of 2±1mm diameter along the entire crystal. Rocking curves shift by about ±20arcmin between domains, while their full width at half-maximum varies between 30 and 50 arcmin. These inhomogeneities are not imprinted at the focal spot, since the monochromatically reflecting area of the crystal is large compared to inhomogeneities. Ray-tracing calculations using a Monte-Carlo-based algorithm developed for mosaic crystals reproduce the X-shaped halo in the focal plane, stemming from the mosaic defocussing in the non-dispersive direction in combination with large apertures. The best achievable resolution is found by analyzing a diversity of rocking curve widths, source sizes and crystal thicknesses for 8 keV x-rays to be ΔE/E ∼ 10-4. Finally a general analytic expression for the shape of the aberration is derived. © 2012 IOP Publishing Ltd and Sissa Medialab srl.Direct measurements of the ionization potential depression in a dense plasma
Physical Review Letters 109:6 (2012)
Abstract:
We have used the Linac Coherent Light Source to generate solid-density aluminum plasmas at temperatures of up to 180 eV. By varying the photon energy of the x rays that both create and probe the plasma, and observing the K-α fluorescence, we can directly measure the position of the K edge of the highly charged ions within the system. The results are found to disagree with the predictions of the extensively used Stewart-Pyatt model, but are consistent with the earlier model of Ecker and Kröll, which predicts significantly greater depression of the ionization potential. © 2012 American Physical Society.Plasma switch as a temporal overlap tool for pump-probe experiments at FEL facilities
Journal of Instrumentation 7:8 (2012)
Abstract:
We have developed an easy-to-use and reliable timing tool to determine the arrival time of an optical laser and a free electron laser (FEL) pulses within the jitter limitation. This timing tool can be used from XUV to X-rays and exploits high FELs intensities. It uses a shadowgraph technique where we optically (at 800 nm) image a plasma created by an intense XUV or X-ray FEL pulse on a transparent sample (glass slide) directly placed at the pump - probe sample position. It is based on the physical principle that the optical properties of the material are drastically changed when its free electron density reaches the critical density. At this point the excited glass sample becomes opaque to the optical laser pulse. The ultra-short and intense XUV or X-ray FEL pulse ensures that a critical electron density can be reached via photoionization and subsequent collisional ionization within the XUV or X-ray FEL pulse duration or even faster. This technique allows to determine the relative arrival time between the optical laser and the FEL pulses in only few single shots with an accuracy mainly limited by the optical laser pulse duration and the jitter between the FEL and the optical laser. Considering the major interest in pump-probe experiments at FEL facilities in general, such a femtosecond resolution timing tool is of utmost importance. © 2012 IOP Publishing Ltd and Sissa Medialab srl.Thomson scattering in short pulse laser experiments
Physics of Plasmas AIP Publishing 19:8 (2012) 083302
Energy transport in short-pulse-laser-heated targets measured using extreme ultraviolet laser backlighting
Physical Review E American Physical Society (APS) 86:2 (2012) 026406