Materials properties facility
Measurements in an applied magnetic field of 14 T, and down to 2 K of:
- Heat capacity
- DC Magnetisation
- AC Magnetisation
- Resistivity
Measurements in an applied magnetic field of 14 T, an applied voltage up to 2 kV, and down to 10 K of:
- Electric polarisation (pyroelectric current)
- Ferroelectric hysteresis loops
If you have been trained to use this facility, please book at this link. Otherwise, please contact Dr. D. Prabhakaran.
X-ray laboratory
- Micro-focused single crystal diffraction down to 10 K
- Powder diffraction
- Reflectometry
- "Synchrotron resolution'' single crystal diffraction
- CCD Laue camera
If you have been trained to use this facility, please book at this link. Otherwise, please contact Prof. Paolo G. Radaelli
Links to other in-house facilities
Please click on the facility of interest to discover more
We prepare high quality bulk single crystals for physics research using a variety of melt and solution growth techniques; we have excellent facilities for sample preparation and characterisation.

Our cryomagnetics group operates and maintains a gaseous helium recovery system with a helium liquefier at its core that is capable of delivering 20 litre/hour with an average annual production of 55,000 litres.

Our electronic engineers group are specialists in the design, analysis and manufacture of bespoke electronics systems from prototype to small production.

Our specialist mechanical engineering team provides design, manufacturing and technical support for projects across the University and for external collaborators.

We provide researchers and external customers with access to cleanroom facilities for micro- and nanofabrication and scanning electron microscopy.

Our focused ion beam facility enables direct-write nanopatterning for device fabrication and site-specific cross-sectioning for sub-surface 3D analysis and metrology at the nanoscale.

Our SEM facility has two FEI/ThermoFisher scanning electron microscopes for high-resolution imaging, metrology and surface characterisation.