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A VUV sub-micron hotspot for photoemission spectroscopy

Vacuum ultraviolet (VUV) lasers have exhibited great potential as the light source for various spectroscopies, which, if they can be focused into a smaller beam spot, will not only allow investigation of mesoscopic materials but also find applications in manufacture of nano-objects with excellent precision. Towards this goal, scientists in China invented a 177 nm VUV laser system that can achieve a record-small (<1 μm) focal spot at a long focal length (~45 mm). This system can be re-equipped for usage in low-cost ARPES and might benefit quantum materials, condensed matter physics and nanophotonics.

Prof Yulin Chen

Professor of Physics

Research theme

  • Quantum materials

Sub department

  • Condensed Matter Physics

Research groups

  • Electronic structures and photoemission spectroscopy
yulin.chen@physics.ox.ac.uk
Clarendon Laboratory, room RM263, Mullard Bldg.
Recent publications
  • About
  • Publications

Observing electronic structures on ex-situ grown topological insulator thin films

Physica Status Solidi - Rapid Research Letters 7:1-2 (2013) 130-132

Authors:

SH Yao, B Zhou, MH Lu, ZK Liu, YB Chen, JG Analytis, C Brüne, WH Dang, SK Mo, ZX Shen, IR Fisher, LW Molenkamp, HL Peng, Z Hussain, YL Chen

Abstract:

Topological insulators represent a new state of quantum matter recently discovered with insulating bulk but conducting surface states formed by an odd number of Dirac fermions. In this Letter, we report our recent progress on the study of electronic structures of ex-situ grown topological insulator thin films by angle resolved photoemission spectroscopy (ARPES). We successfully obtained the topological band structures of molecular beam epitaxial HgTe and vapor-solid grown Bi2Te3 thin films after proper surface cleaning procedures. This new development will not only enable us to study more topological insulators that cannot be measured by conventional in-situ ARPES technique (e.g. by cleaving or growing samples in-situ), but also open the door to directly characterize the electronic properties of topological insulators used in functional devices. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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Selective-area van der waals epitaxy of topological insulator grid nanostructures for broadband transparent flexible electrodes

Advanced Materials (2013)

Authors:

Y Guo, K Zhang, W Jiang, W Zheng, Z Song, J Cao, Z Liu, H Peng, M Aisijiang, Y Chen
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Two-step growth of high quality Bi2Te3 thin films on Al2O3 (0001) by molecular beam epitaxy

APPLIED PHYSICS LETTERS 102:17 (2013) ARTN 171906

Authors:

SE Harrison, S Li, Y Huo, B Zhou, YL Chen, JS Harris
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Weak localization effects as evidence for bulk quantization in Bi2Se3 thin films

PHYSICAL REVIEW B 88:12 (2013) ARTN 121103

Authors:

Li Zhang, Merav Dolev, Qi I Yang, Robert H Hammond, Bo Zhou, Alexander Palevski, Yulin Chen, Aharon Kapitulnik
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Controlling the carriers of topological insulators by bulk and surface doping

Semiconductor Science and Technology 27:12 (2012)

Authors:

B Zhou, ZK Liu, JG Analytis, K Igarashi, SK Mo, DH Lu, RG Moore, IR Fisher, T Sasagawa, ZX Shen, Z Hussain, YL Chen

Abstract:

We report a systematic study of bulk and surface chemical doping effects on single Dirac cone topological insulator Bi2Se3 and Bi2Te3. By bulk doping, we were able to achieve full range control of charge carrier types and concentration, with the exact Fermi energy measured by angle-resolved photoemission spectroscopy (ARPES). Due to the unusual robustness of the topological surface state, we further realized the bi-polar control of the surface carriers by gaseous or alkaline surface doping without affecting the topological nature of these materials. The doping progress monitored by in situ ARPES study clearly demonstrated the switching between different carrier types through the Dirac point. The ability to control the carrier types and the concentration of topological insulators will greatly facilitate future applications. © 2012 IOP Publishing Ltd.
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