Photoconductive detection of arbitrary polarised terahertz pulses
(2006)
Terahertz emission and lifetime measurements of ionimplanted semiconductors: Experiment and simulation
Optics InfoBase Conference Papers (2006)
Abstract:
The spectral width of terahertz emission from ion-implanted terahertz emitters increases with ion damage, owing to ultrafast carrier capture. Carrier dynamics simulations reinforce these findings. Optical-pump, terahertz-probe experiments confirm the subpicosecond lifetimes of these materials. © 2006 Optical Society of America.Broadband terahertz emission from ion-implanted semiconductors
SPRINGER PROC PHYS 110 (2006) 77-80
Abstract:
The terahertz radiation emitted from Fe+ ion-implanted InGaAs surface emitters and InP photoconductive switches was measured. We experimentally observe an increase in the spectral width of terahertz radiation at greater ion damage, which we attribute to the ultrafast capture of photoexcited carriers. Results from a three-dimensional carrier dynamics simulation support this explanation.Carrier dynamics in ion-implanted semiconductors studied by simulation and observation of terahertz emission - art. no. 61180K
P SOC PHOTO-OPT INS 6118 (2006) K1180-K1180
Abstract:
We have experimentally measured the terahertz radiation from a series of ion-implanted semiconductors, both from the bare semiconductor surface and from photoconductive switches fabricated on them. GaAs was implanted with As+ ions, and InGaAs and InP with Fe+ ions, and all samples were annealed post implantation. An increase in emission power is observed at high frequencies, which we attribute to the ultrafast trapping of carriers. We use a three-dimensional carrier dynamics simulation to model the emission process. The simulation accurately predicts the experimentally observed bandwidth increase, without resorting to any fitting parameters. Additionally, we discuss intervalley scattering, the influence of space-charge fields, and the relative performance of InP, GaAs and InAs based photoconductive emitters.Detecting the full polarization state of terahertz transients - art. no. 61200Q
P SOC PHOTO-OPT INS 6120 (2006) Q1200-Q1200