Simulation and optimization of arsenic-implanted THz emitters
(2006)
Photoconductive detection of arbitrary polarised terahertz pulses
(2006)
Terahertz emission and lifetime measurements of ionimplanted semiconductors: Experiment and simulation
Optics InfoBase Conference Papers (2006)
Abstract:
The spectral width of terahertz emission from ion-implanted terahertz emitters increases with ion damage, owing to ultrafast carrier capture. Carrier dynamics simulations reinforce these findings. Optical-pump, terahertz-probe experiments confirm the subpicosecond lifetimes of these materials. © 2006 Optical Society of America.Broadband terahertz emission from ion-implanted semiconductors
SPRINGER PROC PHYS 110 (2006) 77-80