Observing electronic structures on ex-situ grown topological insulator thin films
Physica Status Solidi - Rapid Research Letters 7:1-2 (2013) 130-132
Abstract:
Topological insulators represent a new state of quantum matter recently discovered with insulating bulk but conducting surface states formed by an odd number of Dirac fermions. In this Letter, we report our recent progress on the study of electronic structures of ex-situ grown topological insulator thin films by angle resolved photoemission spectroscopy (ARPES). We successfully obtained the topological band structures of molecular beam epitaxial HgTe and vapor-solid grown Bi2Te3 thin films after proper surface cleaning procedures. This new development will not only enable us to study more topological insulators that cannot be measured by conventional in-situ ARPES technique (e.g. by cleaving or growing samples in-situ), but also open the door to directly characterize the electronic properties of topological insulators used in functional devices. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.Selective-area van der waals epitaxy of topological insulator grid nanostructures for broadband transparent flexible electrodes
Advanced Materials (2013)
Two-step growth of high quality Bi2Te3 thin films on Al2O3 (0001) by molecular beam epitaxy
APPLIED PHYSICS LETTERS 102:17 (2013) ARTN 171906
Weak localization effects as evidence for bulk quantization in Bi2Se3 thin films
PHYSICAL REVIEW B 88:12 (2013) ARTN 121103
Controlling the carriers of topological insulators by bulk and surface doping
Semiconductor Science and Technology 27:12 (2012)