Novel Energy Materials and Advanced Characterisation

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X-ray diffraction, micro-Raman and birefringence imaging of silicon carbide

MATER SCI FORUM 353-3 (2000) 283-286

Authors:

E Pernot, M Mermoux, J Kreisel, O Chaix-Pluchery, P Pernot-Rejmankova, M Anikin, B Pelissier, AM Glazer, R Madar

Abstract:

Transmission and reflection X-ray topography, birefringence imaging and Raman spectroscopy imaging have been performed on a silicon carbide slice. The differences between the images and the information obtained fr-om them are discussed in detail.
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JOURNAL OF APPLIED CRYSTALLOGRAPHY.

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 55 (1999)
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MEASUREMENTS OF BIREFRINGENCE IN NONHOMOGENOUS SAMPLES.

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 55 (1999) 541-541

Authors:

MA Geday, W Kaminsky, AM Glazer
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STUDIES OF FERROIC CRYSTALS BY OPTICAL METHODS

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 55 (1999) 29-29
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A TEM and neutron diffraction study of the local structure in the rhombohedral phase of lead zirconate titanate

JOURNAL OF PHYSICS-CONDENSED MATTER 10:8 (1998) 1767-1786

Authors:

J Ricote, DL Corker, RW Whatmore, SA Impey, AM Glazer, J Dec, K Roleder
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