Experimental and theoretical study of the quantum-confined Stark effect in a single InGaN/GaN quantum dot under applied vertical electric field
SUPERLATTICE MICROST 43:5-6 (2008) 431-435
Abstract:
We present a study of the effect of externally applied vertical electric field on the optical properties of single InGaN/GaN quantum dots via microphotoluminescence spectroscopy. This is achieved by incorporating the quantum dot layer in the intrinsic region of a p-i-n diode structure. We observe a large blue energy shift of similar to 60 meV, which is explained by the partial compensation of the internal piezoelectric field. The energy shift dependence on the applied field allows the determination of the vertical component of the permanent dipole and the polarizability. We also present theoretical modelling of our results based on atomistic semi-empirical tight-binding simulations. A good quantitative agreement between the experiment and the theory is found. (C) 2007 Elsevier Ltd. All rights reserved.Growth and assessment of InGaN quantum dots in a microcavity: A blue single photon source
Materials Science and Engineering: B 147:2-3 (2008) 108-113
Abstract:
Using a modified droplet epitaxy approach in metal-organic vapour phase epitaxy (MOVPE), we have grown InGaN quantum dots (QDs) on top of a 20-period AlN/GaN distributed Bragg reflector (DBR). The QDs were located at the centre of a ca. 182 nm GaN layer. To complete the cavity a three-period SiOx/SiNx DBR was deposited onto the GaN surface. Despite the evolution of roughness during the growth of the AlN/GaN DBR, due to cracking of the AlN layers, a cavity mode was observed, with a quality-factor of ∼50. Enhanced single QD emission was observed in micro-photoluminescence studies of the sample, and photon-correlation spectra provided evidence for single photon emission. © 2007 Elsevier B.V. All rights reserved.Growth and assessment of InGaN quantum dots in a microcavity: A blue single photon source
MAT SCI ENG B-SOLID 147:2-3 (2008) 108-113
Abstract:
Using a modified droplet epitaxy approach in metal-organic vapour phase epitaxy (MOVPE), we have grown InGaN quantum dots (QDs) on top of a 20-period AlN/GaN distributed Bragg reflector (DBR). The QDs were located at the centre ofa ca. 182 nm GaN layer. To complete the cavity a three-period SiOx/SiNx DBR was deposited onto the GaN surface. Despite the evolution of roughness during the growth of the AlN/GaN DBR. due to cracking of the AlN layers, a cavity mode was observed, with a quality-factor of similar to 50. Enhanced single QD emission was observed in micro-photoluminescence studies of the sample, and photon-correlation spectra provided evidence for single photon emission. (C) 2007 Elsevier B.V. All rights reserved.Abnormal photoluminescence properties of GaN nanorods grown on Si(111) by molecular-beam epitaxy
NANOTECHNOLOGY 19:47 (2008) ARTN 475402
Electrically driven single InGaN/GaN quantum dot emission
APPLIED PHYSICS LETTERS 93:23 (2008) ARTN 233103